PMCL-AC160TS

Reflex side aluminum coating
Resonance Frequency (F): 300 kHz Spring Constant (K): 26 N/m
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MEDIUM AND STIFFER MIDDLE SILICON PROBE (NEW CONCEPT CHIP)

 

MODEL NAME

  Coating Metal
(Tip side / Reflex)
PMCL-AC160TS Non / Al
 
PMCL-AC160TS
Cantilever Shape Rectangular
Dimensions (LxWxT, µm) 160x40x3.7
Resonance frequency
(in air, kHz)
300 (±100)
Spring constant
(Stiffness, N/m)
26 (typ.)
Material Silicon (n-type, 0.01 – 0.02 Ω・cm)
Tip Shape Sharpened tetrahedral, ‘Tip View’ structure
Length (µm) 14
Tip radius (nm) 7 (typ.)
Tip angle
(Front)
0 degree
(Back) 35 degree
(Side) Symmetric, Cone half-angle 9 degrees or less
Material Silicon (n-type, 0.1 – 0.4 Ω・cm)
Chip Shape Rectangular cross section, Beveled chip-shoulder
Dimensions (LxWxT, mm) 3.4×1.6×0.3
Packaging Chip configuration in the box Pre-separated chip
Storage box Plastic box with a tacky coating

OUTSTANDING FEATURES OF NEW TETRAHEDRAL CANTILEVER

Application for various sample surfaces:

The mid-range mechanical properties [resonance frequency: 150kHz, spring constant: 9 N/m (typ.)] mean that the PMCL-AC200TS is tailored to any surface from soft to hard.
The stiffer middle mechanical properties [resonance frequency: 300 kHz, spring constant: 26 N/m] means that PMCL-AC160TS is redesigned for revealing sample surface precisely and gently.

Doped silicon cantilever:

The cantilever is made from silicon with a low surface resistance of 0.1 – 0.4 Ω・cm.
This means 1/20 resistance of our conventional cantilevers.

Acclaimed ‘TipView’ structure:

The probe can be easily positioned at the exact point of your interest. The probe is located at the exact end of the cantilever so that the probe apex is not obscured during optical observations.

Ideally point terminated probe:

The probe is tetrahedral, ideally point terminated. The probe apex 1 micron or more is further sharpened.

New concept chip:

The ideally parallel side-walls of the chip make tweezing easy and eliminate problems with chipping and debris.

 

TIP

Below are SEM images of a Tetra tip from the front and side, and the last is a magnified view from side.

Front
Front
Side
Side
Front (probe apex)
Front (probe apex)

Tip shape : sharpened tetrahedral (tilted)
It shows good symmetry viewed from the front and is inclined viewed from the side.

DIMENSION OF LEVERS AND CHIP (SUBSTRATES)

design of AC160TS type2 / lever and chip
lever
design of AC160TS type2 / lever and chip
design of AC160TS type2 / lever and chip

METAL COATING

[Reflex coating]

Thin aluminum film with the thickness of 100nm is coated on the cantilever for reflecting light from the deflection sensor in the AFM equipment. High reflex for high S/N sensing can be expected.

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